IMDb.com, Inc. takes no responsibility for the content or accuracy of the above news articles, Tweets, or blog posts. This content is published for the entertainment of our users only. The news ...

Abstract: Dynamic resistance degradation, which is severely affected by the trapping effect, is a critical challenge for lateral AlGaN/GaN power devices, especially when operating in high-voltage and ...

Abstract: Over the years, significant work has been done on high-integrity systems, such as those found in cars, satellites and aircrafts, to minimize the risk that a logic fault causes a system ...